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Wednesday, October 17 • 3:00pm - 3:50pm
PC3: The Enabling Semiconductor Industry: Condition Monitoring Goes Digital

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Emerging IIoT technologies have the potential to expand the reach of Condition Monitoring to markets and applications not previously practical or economically feasible. Although much of the IIoT conversation has revolved around wireless networks and cloud-based analytics, the real revolution may be taking place at the sensor level. For example, MEMS Accelerometers open the door to highly integrated digital solutions, in physical form factors and power levels that enable the Industrial OEM or Machine Builder to embed specialized CBM sensing solutions inside the machine, not just mounting on the machine after it is installed in the factory.  Digital sensor solutions enabled by solid state electronics can integrate data processing capabilities, generating condition indicators that can be communicated to the machine controller via an appropriate digital protocol. This session discusses the potential for digital sensor solutions enabled by solid state technologies to expand the art of Condition Monitoring to new types of equipment.

Speakers
avatar for Ed Spence

Ed Spence

Founder & Managing Director, The Machine Instrumentation Group
Ed Spence is the Managing Director and Founder of The Machine Instrumentation Group, a collaborative network of CBM product and service providers.The mission of The Machine Instrumentation Group is to implement condition monitoring solutions for machine health problems that resist... Read More →


Wednesday October 17, 2018 3:00pm - 3:50pm CDT
Theater 3